eN-XTAL
eN-XTAL is a fully automated, standalone microfluidic system engineered for rapid, reliable, and high-throughput crystallization screening. Seamlessly controlled via an intuitive graphical user interface, the eN-XTAL platform eliminates manual bottlenecks, allowing you to characterize and optimize processes faster and more accurately than traditional batch methods.
Comprehensive Analytical Capabilities
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Advanced Kinetic Mapping: Accurately measure crystal growth rates, nucleation rates, and identify polymorph formation in real-time.
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Equilibrium Analysis: Precisely map solid-liquid and liquid-liquid equilibrium, easily navigating complex phase behaviors like oiling-out during crystallization.
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Multi-Modal Sensor Integration: Combines electrochemical sensors for continuous supersaturation tracking, in-line Raman spectroscopy for structural identification, and optical sensing for rapid turbidity and induction time analysis.
Plug-and-Play Hardware Architecture
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Continuous-Flow Fluidics: Achieve highly controlled growth-rate evaluations utilizing scalable continuous-flow methodology.
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Modular Design: Effortlessly switch between testing parameters using our proprietary snap-on microfluidic modules.
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Motorized Precision: Fully integrated with a motorized XYZ translation stage to guarantee repeatable, automated high-throughput screening without user intervention.
High-throughput sensor integrated Microfluidic device.